CPC

CPC Class H04N

65 patents in CPC class H04N

65 Patents
0 Views
Updated 2/24/2026

Top Patents

Systems and methods are described that protect intellectual property rights in connection with 3-dimensional printing processes. In certain embodiments, an object a user would like to render with a 3-dimensional printing device may be compared with one or more managed objects having certain associated intellectual property rights. If the object is found to be similar to a managed object (e.g., similar in shape, function, composition, etc.), policy associated with the managed object may be enforced in connection with rendering the object. In this manner, intellectual property rights associated with the managed objects may be enforced.

A protecting method for accessing material data adopted by a printer having a processing unit, a MCU for storing material data, and a transmission interface is disclosed. The method includes following steps of: determining whether to decide a data format at the processing unit once the material data is to be saved or read; generating confirm signal to be transmitted to the MCU through the transmission interface if the data format needs to be decided; looking up a table or performing a calculation according to content of the confirm signal at both the processing unit and the MCU for obtaining a corresponding data format; and, generating and transmitting transmission signal which includes the material data based on the corresponding data format by the processing unit and the MCU.

An image forensics system estimates a camera response function (CRF) associated with a digital image, and compares the estimated CRF to a set of rules and compares the estimated CRF to a known CRF. The known CRF is associated with a make and a model of an image sensing device. The system applies a fusion analysis to results obtained from comparing the estimated CRF to a set of rules and from comparing the estimated CRF to the known CRF, and assesses the integrity of the digital image as a function of the fusion analysis.

Explore More Patents

Discover additional patents in the cpc category

Browse All Patents