CPC Class H04N

The embodiments of the present disclosure provide a pixel sensing circuit. The photoelectric conversion sub-circuit is configured to collect an incident light, and generate an electrical signal based on the incident light collected, so as to charge the signal collection point. The resetting sub-circuit is configured to write a first power supply voltage from the first power supply terminal to the signal collection point. The compensation and pulling-up sub-circuit is configured to: obtain a threshold voltage of the conversion transistor; generate a compensation voltage according to the threshold voltage; write the compensation voltage to the signal collection point; pull up the voltage at the signal collection point. The selection sub-circuit is configured to control the connection between the first electrode of the conversion transistor and an image processor. The conversion transistor is configured to output the current signal according to the voltage at the signal collection point.

A system that may include (a) a radiation source that is constructed and arranged to illuminate an object with radiation during consecutive time frames of microsecond-scale duration, wherein radiation emitted during one time frame differs by energy from radiation transmitted during an adjacent time frame; and (b) a CMOS sensor that may include a readout circuit and CMOS pixels. Each CMOS pixel may include a radiation sensing element and in-pixel memory elements. Different in-pixel memory elements are constructed and arranged to sample a state of the radiation sensing element during different time frames of the consecutive time frames.

Provided are a comparison device that may minimize an influence of banding noise by offsetting the banding noise, and a CMOS image sensor including the comparison device. The comparison device may include a comparison circuit configured to compare a pixel signal and a ramp signal with each other and output a comparison signal, a banding noise adjustment circuit coupled to the comparison circuit to adjust electrical characteristic values of the comparison circuit, a banding value generation circuit coupled to the banding noise adjustment circuit to provide the banding noise adjustment circuit with a banding value generated based on a setting code value, and a banding noise reduction circuit coupled to the banding noise adjustment circuit and configured to reduce the banding noise of the comparison circuit by adjusting electrical characteristic values of the comparison circuit.