Legal claims defining the scope of protection. Each claim is shown in both the original legal language and a plain English translation.
1. A method of compensating degradation of an organic light emitting device (OLED) in an array-based semiconductor device having arrays of pixels that include OLEDs, said method comprising: determining operating conditions for the OLED with respect to at least two of temperature condition, stress condition, initial characteristics, and age condition; measuring an electrical operating parameter of said OLED; determining degradation of said OLED using said operating conditions for the OLED, said measured electrical operating parameter, and two sets of interdependency curves, each curve directly relating changes in the electrical operating parameter of said OLEDs and the luminance degradation of said OLEDs in said array-based semiconductor device, each set of interdependency curves based on a different operating condition; determining a correction factor for the OLED with use of said degradation; and compensating for said degradation with use of said correction factor.
2. The method according to claim 1 , further comprising: determining, for the plurality of operating conditions, interdependency curves, each curve directly relating changes in the electrical operating parameter of said OLEDs and the luminance degradation of said OLEDs in said array-based semiconductor device.
This invention relates to methods for analyzing and managing the performance of organic light-emitting diode (OLED) arrays in semiconductor devices. The technology addresses the challenge of predicting and mitigating luminance degradation in OLEDs under varying operating conditions, which is critical for maintaining display quality and longevity in electronic devices. The method involves determining interdependency curves for a plurality of operating conditions. Each curve directly correlates changes in an electrical operating parameter of the OLEDs with their luminance degradation. This analysis helps identify how different electrical inputs, such as voltage or current, affect the light output and degradation rate of the OLEDs. By establishing these relationships, the method enables precise control and optimization of OLED performance, ensuring consistent brightness and reducing premature failure. The approach is particularly useful in applications where OLEDs are subjected to diverse operating environments, such as in displays, lighting systems, or sensors. By understanding the interplay between electrical parameters and degradation, manufacturers can design more reliable devices and implement adaptive control strategies to extend the lifespan of OLED-based systems. The method provides a systematic way to assess and manage OLED performance, addressing a key limitation in the widespread adoption of OLED technology.
3. The method according to claim 2 , wherein each interdependency curve has an associated temperature condition and a stress condition, and wherein determining the degradation comprises: determining at least one temperature associated interdependency curve with use of said temperature; and determining from said at least one temperature associated interdependency curve and a stress level and said measured electrical operating parameter, the degradation of the OLED.
This invention relates to methods for assessing degradation in organic light-emitting diode (OLED) devices by analyzing interdependency curves that correlate temperature, stress, and electrical operating parameters. The method addresses the challenge of accurately predicting OLED degradation under varying operating conditions, which is critical for improving device reliability and lifespan. The method involves determining degradation by first identifying at least one interdependency curve associated with a specific temperature condition. Each interdependency curve links temperature, stress, and electrical operating parameters, allowing for precise degradation assessment. The method then uses the identified temperature-associated curve, along with a measured stress level and an electrical operating parameter (such as current, voltage, or luminance), to calculate the degradation of the OLED. This approach enables real-time monitoring and adjustment of OLED performance based on dynamic operating conditions, ensuring optimal functionality and longevity. The technique is particularly useful in applications where OLEDs are subjected to fluctuating thermal and stress environments, such as displays and lighting systems. By leveraging these interdependency curves, the method provides a more accurate and efficient way to assess degradation compared to traditional methods that rely on static or simplified models.
4. The method according to claim 1 , wherein after the correction factor for the OLED has been determined, a start point associated with the interdependency curves is reset.
This invention relates to display calibration techniques for organic light-emitting diode (OLED) displays, addressing the challenge of maintaining accurate color and brightness over time as OLED devices degrade. The method involves determining a correction factor for the OLED display to compensate for aging effects, ensuring consistent performance. After calculating this correction factor, the system resets a start point associated with interdependency curves used in the calibration process. These interdependency curves represent relationships between display parameters, such as voltage, current, and luminance, which shift as the OLED degrades. By resetting the start point, the calibration process can accurately recalibrate the display using updated curve data, improving long-term stability. The method ensures that the display maintains color accuracy and brightness uniformity despite gradual degradation of the OLED materials. This approach is particularly useful in high-end displays where precise color reproduction is critical, such as in professional monitors or medical imaging devices. The reset mechanism prevents drift in calibration accuracy, extending the lifespan of the display while maintaining performance.
5. The method according to claim 1 , further comprising: determining, for a plurality of effective stress levels in the stress history, which factor in temperature, interdependency curves, or at least a plurality of points of interest, directly relating changes in the electrical operating parameter of said OLEDs and the luminance degradation of said OLEDs in said array-based semiconductor device.
This invention relates to the field of organic light-emitting diode (OLED) devices, specifically addressing the challenge of accurately predicting luminance degradation in OLED arrays under varying operating conditions. The method involves analyzing the relationship between electrical operating parameters and luminance degradation in OLEDs within an array-based semiconductor device. The process includes determining how changes in electrical operating parameters, such as current or voltage, correlate with luminance degradation across multiple effective stress levels in the device's stress history. Additionally, the method accounts for factors like temperature, interdependency curves, and key points of interest that influence this degradation. By systematically evaluating these factors, the method provides a more precise model for predicting OLED performance over time, enabling better reliability assessments and optimization of device operation. The approach is particularly useful for applications requiring long-term stability, such as displays and lighting systems, where maintaining consistent luminance is critical. The method ensures that degradation patterns are accurately captured, allowing for proactive adjustments to extend the lifespan of OLED devices.
6. The method according to claim 1 , wherein determining for a plurality of operating conditions interdependency curves comprises: extracting initial characteristics for each of a plurality of test OLEDs; repeatedly subjecting the test OLEDs to different stress conditions until all test OLEDs are measured; and extracting interdependency curves for said test OLEDs and storing said interdependency curves such that each interdependency curve is associated with at least one stress condition and an initial device characteristic condition.
This invention relates to the characterization of organic light-emitting diodes (OLEDs) under varying operating conditions. The problem addressed is the need to accurately model the performance degradation of OLEDs when subjected to different stress conditions, such as electrical, thermal, or environmental stress, to improve their reliability and longevity in display and lighting applications. The method involves analyzing the interdependency between OLED performance and stress conditions by first extracting initial characteristics from multiple test OLEDs. These test OLEDs are then repeatedly exposed to different stress conditions, such as varying voltage, current, temperature, or humidity levels, until all devices are measured. During this process, performance data is collected to determine how the OLEDs degrade over time under each stress condition. The resulting interdependency curves, which map the relationship between stress conditions and OLED degradation, are then stored in a database. Each curve is associated with at least one specific stress condition and the initial characteristics of the OLED, allowing for precise modeling of device behavior under different operating scenarios. This approach enables manufacturers to predict OLED lifespan and optimize device design for improved durability.
7. The method according to claim 6 , further comprising: updating remotely a set of interdependency curves stored with the array-based semiconductor device with a set of prepared interdependency curves from a remote interdependency curve library at least twice after fabrication of the array-based semiconductor device.
The invention relates to semiconductor devices, specifically array-based semiconductor devices, and addresses the challenge of maintaining optimal performance by dynamically adjusting interdependency curves post-fabrication. Interdependency curves define relationships between operational parameters (e.g., voltage, current, temperature) in semiconductor arrays, but these relationships can degrade or shift over time due to wear, environmental changes, or manufacturing variations. The invention provides a method to remotely update these curves after device fabrication to ensure continued efficiency and reliability. The method involves storing a set of interdependency curves with the semiconductor device during initial fabrication. After deployment, the device periodically receives updated interdependency curves from a remote library at least twice. These updates are prepared based on real-world performance data, aging models, or environmental conditions, allowing the device to adapt without physical intervention. The remote library may contain pre-calculated curves tailored to specific device models or operational scenarios. By enabling remote updates, the invention reduces downtime, extends device lifespan, and improves energy efficiency. This approach is particularly useful in large-scale semiconductor arrays where manual recalibration is impractical.
8. The method according to claim 7 , wherein the updating remotely occurs at the time of at least two of: shipping the array-based semiconductor device to the manufacturer, integrating the array-based semiconductor device into a product, and operation of the array-based semiconductor device at a consumer site.
This invention relates to updating array-based semiconductor devices, particularly in the context of manufacturing, integration, and consumer use. The technology addresses the challenge of ensuring that semiconductor devices remain current with the latest firmware or configuration updates, even after they have been shipped or integrated into products. The method involves remotely updating the semiconductor device at multiple stages of its lifecycle, including during shipping to the manufacturer, integration into a product, and operation at a consumer site. This ensures that the device is always running the most up-to-date software or configurations, improving performance, security, and functionality. The updates can be triggered automatically or manually, depending on the stage of the device's lifecycle. This approach reduces the need for physical intervention, minimizes downtime, and ensures consistency across different stages of the device's deployment. The invention is particularly useful in industries where semiconductor devices are used in critical applications, such as automotive, aerospace, and consumer electronics, where timely updates are essential for maintaining optimal performance and security.
9. The method according to claim 1 , wherein determining the efficiency degradation comprises: initializing a total effective stress time value; sampling brightness data for said OLED; calculating an effective stress time corresponding to said sampling for at least one given reference stress level; updating the total effective stress time for said OLED based on the at least one given stress level; determining whether to sample more brightness data; and in a case no more brightness data are to be sampled, updating the efficiency degradation with use of the total effective stress, and the interdependency curves.
This invention relates to monitoring and assessing the efficiency degradation of organic light-emitting diode (OLED) devices over time. OLEDs degrade in brightness and efficiency due to prolonged use, and accurately tracking this degradation is critical for maintaining display quality and reliability. The method involves initializing a total effective stress time value, which quantifies the cumulative stress experienced by the OLED. Brightness data is sampled from the OLED, and an effective stress time is calculated for each sampling interval based on a predefined reference stress level. The total effective stress time is then updated by incorporating the newly calculated stress time. The process determines whether additional brightness data should be sampled, and if not, the efficiency degradation is updated using the total effective stress time and pre-established interdependency curves that relate stress time to efficiency loss. This approach allows for real-time or periodic assessment of OLED degradation, enabling predictive maintenance and performance optimization. The method ensures accurate tracking of efficiency degradation by continuously updating the stress time and applying interdependency curves to reflect the OLED's aging characteristics.
10. The method according to claim 9 , wherein determining whether to sample more brightness data comprises comparing the total effective stress time with a predetermined threshold.
A method for optimizing brightness data sampling in a display system addresses the challenge of efficiently managing power consumption and image quality. The method involves monitoring the total effective stress time of display elements, which measures the cumulative time the elements are subjected to high brightness levels. By comparing this stress time against a predetermined threshold, the system determines whether additional brightness data sampling is necessary. If the stress time exceeds the threshold, the system triggers further sampling to gather more detailed brightness data, ensuring accurate adjustments to brightness levels. This prevents overstressing display elements while maintaining optimal image quality. The method integrates with a broader system that adjusts brightness based on environmental conditions, user preferences, and display characteristics, ensuring balanced performance and longevity. The threshold comparison step acts as a decision point to balance power efficiency and display accuracy, adapting dynamically to varying usage scenarios. This approach enhances display durability and energy efficiency without compromising visual performance.
11. The method according to claim 1 , wherein determining the efficiency degradation comprises: initializing a total change in degradation factor; sampling brightness data for said OLED; calculating a change in degradation corresponding to the sampled brightness; updating the total change in degradation factor for said OLED; determining whether to sample more brightness data; and in a case no more brightness data are to be sampled, updating the efficiency degradation with use of the total change in degradation factor, and the interdependency curves.
This invention relates to monitoring and assessing efficiency degradation in organic light-emitting diode (OLED) displays. OLEDs degrade over time, leading to reduced brightness and efficiency, which impacts display performance. The invention provides a method to accurately track and quantify this degradation by analyzing brightness data and interdependency curves that describe the relationship between degradation factors. The method initializes a total change in degradation factor, then samples brightness data from the OLED. Based on this data, it calculates a change in degradation corresponding to the sampled brightness. The total change in degradation factor is then updated. The process determines whether additional brightness data should be sampled. If no further sampling is needed, the efficiency degradation is updated using the total change in degradation factor and the interdependency curves, which account for how different factors influence degradation. This approach allows for precise tracking of OLED efficiency loss over time, enabling better maintenance and performance optimization of OLED displays. The method ensures accurate degradation assessment by continuously updating the degradation factor and incorporating interdependency relationships between degradation factors.
12. The method according to claim 11 , wherein determining whether to sample more brightness data comprises comparing the total change in degradation factor with a predetermined change in degradation threshold.
A method for optimizing brightness data sampling in display systems addresses the challenge of efficiently monitoring and adjusting display performance over time. The method involves tracking degradation factors, such as brightness decay or color shift, to determine when additional sampling is needed. By comparing the total change in degradation factor against a predetermined threshold, the system can dynamically decide whether to collect more brightness data. This adaptive approach ensures accurate performance monitoring while minimizing unnecessary measurements, improving efficiency and longevity of the display. The method integrates with a broader system that periodically samples brightness data and adjusts display parameters based on degradation trends. The comparison step allows the system to respond to significant changes in degradation, ensuring timely adjustments without excessive resource usage. This technique is particularly useful in high-precision display applications where maintaining consistent brightness and color accuracy is critical. The method enhances reliability by preventing over-sampling while ensuring critical degradation events are detected and addressed.
13. A method of compensating degradation of an organic light emitting device (OLED) in an array-based semiconductor device having arrays of pixels that include OLEDs, said method comprising: determining an effective stress for the OLED in respect of a stress condition and a temperature condition; measuring an electrical operating parameter of said OLED; determining degradation of said OLED using said temperature condition for the OLED, said measured electrical operating parameter, and a set of interdependency curves, or at least a plurality of points of interest, directly relating changes in the electrical operating parameter of said OLEDs and the luminance degradation of said OLEDs in said array-based semiconductor device, the set of interdependency curves based on effective stress conditions, which is calculated using both a temperature history and a stress history of the OLED; determining a correction factor for the OLED with use of said degradation; and compensating for said degradation with use of said correction factor.
This technical summary describes a method for compensating degradation in organic light-emitting devices (OLEDs) within an array-based semiconductor device, such as a display. The method addresses the problem of luminance degradation in OLEDs over time due to stress and temperature conditions, which can lead to uneven brightness and reduced display quality. The method involves determining an effective stress for an OLED based on its stress and temperature conditions. An electrical operating parameter of the OLED is measured, and degradation is assessed using the temperature condition, the measured parameter, and a set of interdependency curves or key data points. These curves relate changes in the electrical operating parameter to luminance degradation, accounting for effective stress conditions derived from the OLED's temperature and stress history. A correction factor is then calculated based on the degradation assessment, and this factor is applied to compensate for the degradation, ensuring consistent luminance across the OLED array. The approach enables real-time or periodic adjustments to maintain display performance over time.
14. The method according to claim 13 , wherein after the correction factor for the OLED has been determined, a start point associated with the interdependency curves is reset.
The invention relates to a method for calibrating and correcting display characteristics of an OLED (organic light-emitting diode) device. The method addresses the problem of maintaining accurate color and brightness performance in OLED displays over time, as these devices can degrade due to factors such as aging, temperature variations, and usage patterns. The method involves determining a correction factor for the OLED to compensate for these variations, ensuring consistent display quality. The method includes generating interdependency curves that represent the relationship between different display parameters, such as voltage, current, and luminance, under varying conditions. These curves are used to model the behavior of the OLED and derive the correction factor. Once the correction factor is determined, the method resets a start point associated with the interdependency curves. This reset ensures that subsequent measurements and corrections are based on updated, accurate data, preventing cumulative errors and maintaining long-term display performance. The method may also involve storing the correction factor in a lookup table or memory for future reference, allowing the system to apply the correction dynamically during operation. This approach improves the reliability and longevity of OLED displays by compensating for real-time variations and degradation. The method is particularly useful in applications where precise color and brightness control are critical, such as high-end televisions, medical displays, and professional imaging systems.
15. The method according to claim 13 , wherein each interdependency curve has an associated effective stress history as a function of at least the temperature condition and the stress condition, and wherein determining an efficiency degradation comprises: determining an effective stress history for the OLED with use of the temperature history and the stress history; and determining from said interdependency curves and said effective stress history and said measured electrical operating parameter the efficiency degradation of the OLED.
This invention relates to methods for assessing efficiency degradation in organic light-emitting diodes (OLEDs) based on operational conditions. The problem addressed is accurately predicting OLED efficiency loss over time, which is influenced by factors such as temperature and stress conditions. The method involves analyzing interdependency curves that correlate efficiency degradation with operational parameters. Each interdependency curve is linked to an effective stress history, which is derived from temperature and stress conditions over time. The method determines the OLED's efficiency degradation by calculating the effective stress history using recorded temperature and stress data, then applying this history along with measured electrical operating parameters to the interdependency curves. This approach allows for precise modeling of efficiency loss, accounting for real-world operational variations. The technique is particularly useful for evaluating long-term performance and reliability of OLEDs in display and lighting applications. By integrating historical operational data with predefined interdependency relationships, the method provides a robust framework for predicting degradation without requiring invasive testing. This enables manufacturers and designers to optimize OLED usage and improve product longevity.
16. A method of compensating for degradation of an organic light emitting device (OLED) in an array-based semiconductor device having arrays of pixels that include OLEDs, said method comprising: determining for each of a plurality of operating conditions at least one degradation-time curve, each curve directly relating changes in a stress time parameter associated with said OLEDs and the luminance degradation of said OLEDs in said array-based semiconductor device, the plurality of operating stress conditions comprising at least two operating conditions selected from stress, temperature, and initial device characteristics; measuring at least one operating condition for the OLED; determining a degradation of said OLED using said each set of degradation-time curves, and said at least one operating condition for the OLED; determining a correction factor for the OLED with use of said degradation; and compensating for said degradation with use of said correction factor.
This invention relates to a method for compensating for luminance degradation in organic light-emitting diodes (OLEDs) within an array-based semiconductor device, such as a display. OLEDs degrade over time, leading to reduced brightness and color shifts, which can affect display quality. The method addresses this by dynamically adjusting the OLED's operation to counteract degradation effects. The method involves first determining degradation-time curves for multiple operating conditions, such as stress levels, temperature, and initial device characteristics. Each curve maps changes in a stress time parameter (e.g., cumulative operating time) to luminance degradation. During operation, the method measures at least one current operating condition (e.g., temperature or stress level) of the OLED. Using the pre-determined degradation-time curves and the measured operating condition, the method calculates the OLED's degradation. A correction factor is then derived from this degradation data. Finally, the OLED's operation is adjusted using the correction factor to compensate for the degradation, ensuring consistent luminance output. This approach allows for real-time compensation by accounting for varying operating conditions, improving the longevity and performance of OLED-based displays. The method is particularly useful in applications where precise color and brightness control are critical, such as high-end displays and lighting systems.
17. The method according to claim 16 , wherein after the correction factor for the OLED has been determined, a start point associated with the at least one degradation-time curve is reset.
The invention relates to methods for compensating for degradation in organic light-emitting diode (OLED) displays. OLEDs degrade over time, leading to variations in brightness and color accuracy, which affects display quality. The invention addresses this by dynamically adjusting display parameters to compensate for degradation. The method involves determining a correction factor for the OLED based on its degradation characteristics. This correction factor is used to adjust the display's output to maintain consistent brightness and color. The method further includes tracking the OLED's degradation over time using at least one degradation-time curve, which represents how the OLED's performance changes as it ages. After the correction factor is determined, the start point of the degradation-time curve is reset. This reset ensures that the degradation tracking remains accurate by aligning the curve with the current state of the OLED, allowing for precise compensation adjustments over the device's lifespan. The method may also involve storing the degradation-time curve in a lookup table for efficient retrieval and updating. By resetting the start point, the system avoids cumulative errors in degradation tracking, improving long-term display performance.
18. The method according to claim 16 , wherein determining the efficiency degradation comprises: initializing a total effective stress time value; sampling brightness data for said OLED; calculating an effective stress time corresponding to said sampling for at least one given reference stress level; updating the total effective stress time for said OLED based on the at least one given stress level; determining whether to sample more brightness data; and in a case no more brightness data are to be sampled, updating the degradation with use of the total effective stress, and the at least one degradation-time curve.
This invention relates to monitoring and predicting efficiency degradation in organic light-emitting diode (OLED) displays. OLEDs degrade over time due to stress from electrical and optical usage, leading to reduced brightness and efficiency. The invention provides a method to quantify this degradation by tracking stress accumulation and applying degradation-time curves to estimate remaining performance. The method initializes a total effective stress time value for an OLED. Brightness data is sampled periodically, and for each sample, an effective stress time is calculated based on a reference stress level. The total effective stress time is updated by accumulating these values. The process continues until no more brightness data is needed, at which point the total effective stress is used to update the degradation estimate. This involves applying at least one degradation-time curve, which correlates stress time to efficiency loss, to determine the current degradation state of the OLED. The method enables real-time monitoring of OLED health, allowing for predictive maintenance or adjustments to display performance.
19. The method according to claim 16 , wherein determining the efficiency degradation comprises: initializing a total change in degradation factor; sampling brightness data for said OLED; calculating a change in degradation corresponding to the sampled brightness; updating the total change in degradation factor for said OLED; determining whether to sample more brightness data; and in a case no more brightness data are to be sampled, updating the degradation with use of the total change in degradation factor, and the at least one degradation-time curve.
This invention relates to monitoring and assessing the efficiency degradation of organic light-emitting diode (OLED) displays. OLEDs degrade over time, leading to reduced brightness and efficiency, which impacts display performance. The invention provides a method to accurately track and quantify this degradation to improve display longevity and reliability. The method involves initializing a total change in degradation factor for an OLED. Brightness data is sampled from the OLED, and a change in degradation is calculated based on this sampled data. The total change in degradation factor is then updated. The process determines whether additional brightness data should be sampled. If no further sampling is needed, the degradation is updated using the total change in degradation factor and at least one degradation-time curve, which models the expected degradation over time. This approach allows for precise tracking of OLED degradation, enabling adjustments to maintain display performance. The method ensures accurate efficiency measurements by continuously sampling brightness data and refining the degradation factor, leading to better long-term display management. The use of degradation-time curves helps predict future performance, allowing for proactive maintenance or adjustments.
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June 30, 2020
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