The present invention relates to a fabrication method for polycrystalline silicon thin that is capable of providing uniform crystallization of polycrystalline silicon thin film by laser using a mask having a mixed structure of laser transmission regions and laser non-transmission regions, wherein the laser transmission regions exist asymmetrically on the basis of a laser scanning directional axis, and the laser transmission regions exist symmetrically on the basis of a certain central axis, and the laser transmission regions are shifted to a certain distance on the basis of another axis parallel to the certain central axis, so that the laser transmission regions and non laser transmission regions are alternately positioned.
Legal claims defining the scope of protection. Each claim is shown in both the original legal language and a plain English translation.
1. A method for fabricating a polycrystalline silicon thin film out of amorphous silicon using laser, comprising: placing a mask having mask patterns forming laser transmission regions and laser non-transmission regions on a semiconductor layer; scanning a first laser beam through the mask onto a first area of the semiconductor layer, while a relative position of the mask with respect to the semiconductor layer is fixed at a first location; shifting the mask from the first location to a second location, on the basis of an axis parallel to a predetermined central axis and without radiating a laser beam onto the semiconductor layer after radiating the first laser beam; and scanning a second laser beam through the shifted mask and across a second area of the semiconductor layer, while the relative position of the mask with respect to the semiconductor layer is fixed at the second location, wherein the laser transmission regions exist asymmetrically on the basis of a laser scanning directional axis, and the laser transmission regions exist symmetrically on the basis of a predetermined central axis, wherein the laser transmission regions and the laser non-transmission regions are alternately positioned, wherein a laser transmission region has a structure in which laser transmission regions partially overlap in a direction perpendicular to the laser scanning directional axis when the mask is shifted the distance based on the axis parallel to the predetermined central axis, wherein a distance of the overlap between laser transmission regions is shorter than a width of the laser transmission region in a direction perpendicular to the laser scanning directional axis, wherein at least one laser transmission region is spaced apart by a different distance from the two other adjacent transmission regions disposed in a direction perpendicular to the laser scanning directional axis, the at least one laser transmission region is disposed between the two other adjacent transmission regions, and the at least one laser transmission region and the two other adjacent transmission regions are three successive laser transmission regions, wherein the laser transmission regions comprise a first laser transmission region of a line shaped pattern, a second laser transmission region of a line shaped pattern, and a third laser transmission region of a line shaped pattern, and wherein the length of the third laser transmission region is greater than the sum of the length of the first laser transmission region and the length of the second laser transmission region.
A method for creating a uniform polycrystalline silicon thin film from amorphous silicon using a laser and a mask. The mask has a pattern of laser transmission (open) and non-transmission (blocked) regions. A laser scans across the amorphous silicon through the mask. The open regions are asymmetric relative to the laser scan direction but symmetric around a central axis. The open regions and blocked regions are positioned alternately. Open regions partially overlap when the mask is shifted along an axis parallel to the central axis, with the overlap being less than the width of the open region. At least one open region is spaced differently from its two adjacent open regions (creating an irregular pattern) in the direction perpendicular to the laser scan. The open regions include three successive regions: a first line, a second line, and a third line, where the third line is longer than the combined length of the first and second lines. The mask is shifted after the first scan, then the laser scans again.
2. The method of claim 1 , wherein the laser transmission regions are congruent, line shaped regions.
The polycrystalline silicon thin film fabrication method, which uses a laser and mask with asymmetric/symmetric transmission regions, as described in the previous method, wherein the laser transmission regions are congruent line-shaped regions, meaning each open line is identical to the others.
3. The method of claim 1 , wherein the axis parallel to the predetermined central axis is positioned at a center of the mask, and the distance the masked is shifted is as much as ¼ of a width of the mask based on the axis parallel to the predetermined central axis.
The polycrystalline silicon thin film fabrication method, which uses a laser and mask with asymmetric/symmetric transmission regions, as described in the previous method, wherein the axis parallel to the predetermined central axis is located in the center of the mask, and the mask is shifted by a distance equal to one-fourth of the mask's width along that parallel axis.
4. The method of claim 1 , wherein the predetermined central axis is perpendicular to the laser scanning directional axis.
The polycrystalline silicon thin film fabrication method, which uses a laser and mask with asymmetric/symmetric transmission regions, as described in the previous method, wherein the predetermined central axis (around which the mask transmission regions are symmetrical) is perpendicular to the direction of the laser scan.
5. The method of claim 1 , wherein the axis parallel to the predetermined central axis is perpendicular to the laser scanning directional axis and positioned at a center of the mask.
The polycrystalline silicon thin film fabrication method, which uses a laser and mask with asymmetric/symmetric transmission regions, as described in the previous method, wherein the axis parallel to the predetermined central axis is both perpendicular to the laser scanning direction and positioned at the center of the mask.
6. The method of claim 1 , wherein the laser transmission regions exist asymmetrically on the basis of an y axis.
The polycrystalline silicon thin film fabrication method, which uses a laser and mask with asymmetric/symmetric transmission regions, as described in the previous method, wherein the laser transmission regions are asymmetrically positioned relative to a "y" axis (likely referring to a coordinate system aligned with the mask).
7. A method for fabricating a polycrystalline silicon thin film using a laser through a mask, comprising: forming a first polycrystalline silicon region on a substrate while a relative position of the mask with respect to the substrate is fixed at a first location, by scanning a laser beam across the first polycrystalline region, the first polycrystalline silicon region comprising first areas, the first areas being asymmetrical to each other on the basis of a laser scanning directional axis and being symmetrical to each other on the basis of a central axis of the first polycrystalline silicon region that is perpendicular to the laser scanning directional axis, and three successive first areas comprise a middle first area of the three successive first areas that is spaced apart by different distances from the other two first areas of the three successive first areas, the three successive first areas being disposed in a direction perpendicular to the laser scanning directional axis; shifting a mask from the first location to a second location in the scanning direction without radiating a laser beam onto the substrate; and forming a second polycrystalline silicon region on the substrate while the relative position of the mask with respect to the substrate is fixed at second location, by scanning a laser beam across the second polycrystalline silicon region, the second polycrystalline silicon region comprising second areas, the second areas being asymmetrical to each other on the basis of the laser scanning directional axis and being symmetrical to each other on the basis of a central axis of the second polycrystalline silicon region that is perpendicular to the laser scanning directional axis, and three successive second areas comprise a middle second area of the three successive second areas that is spaced apart by different distances from the other two second areas of the three successive second areas, the three successive second areas being disposed in the direction perpendicular to the laser scanning directional axis, wherein the second areas partially overlap the first areas in the direction perpendicular to the laser scanning directional axis, a distance of the overlap between the second areas and the first areas is shorter than a width of one second area in the direction perpendicular to the laser scanning directional axis, wherein the first areas comprise: a first, first area of a line shaped pattern, a second, first area of a line shaped pattern, and a third, first area of a line shaped pattern, wherein the length of the third, first area is greater than the sum of the length of the first, first area and the length of the second, first area, wherein the second areas comprise: a first, second area of a line shaped pattern, a second, second area of a line shaped pattern, and a third, second area of a line shaped pattern, and wherein the length of the third, second area is greater than the sum of the length of the first, second area and the length of the second, second area.
A method for creating a polycrystalline silicon thin film on a substrate using a laser and a mask. The laser scans a first area of the substrate through the mask, forming a first polycrystalline silicon region. This region contains sub-areas that are asymmetrically arranged relative to the laser scan direction but symmetrically arranged relative to a central axis (perpendicular to the scan). Three successive sub-areas include a middle area spaced differently from the other two. The mask is then shifted along the scanning direction without laser firing. A second laser scan creates a second polycrystalline silicon region with similar asymmetric/symmetric sub-areas. The second region's sub-areas partially overlap the first region's sub-areas, with the overlap being less than the width of one sub-area. Both the first and second regions contain three successive areas shaped as lines: the first, first area, the second, first area, and the third, first area. Similarly for the second scan: first second area, second second area, and third second area. The length of the third line is longer than the combined lengths of the first and second lines in both regions.
8. The method of claim 7 , wherein the first areas and the second areas are congruent, line shaped areas.
The polycrystalline silicon thin film fabrication method described previously, wherein the first and second regions are created by scanning a laser through a mask and the first and second areas are congruent line shaped areas, meaning all lines created are identical.
Cooperative Patent Classification codes for this invention. Click any code to explore related patents in that topic.
October 12, 2004
July 16, 2013
Browse 5M+ US patents with plain-English claim translations and AI-generated analysis.